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Other articles related with "negative bias temperature instability (NBTI)"：
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128502 |
Wei-Tai Gong(巩伟泰), Yan Li(李闫), Ya-Bin Sun(孙亚宾), Yan-Ling Shi(石艳玲), and Xiao-Jin Li(李小进) |
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Investigation of degradation and recovery characteristics of NBTI in 28-nm high-k metal gate process |
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Chin. Phys. B
2023 Vol.32 (12): 128502-128502
[Abstract]
(105)
[HTML 0 KB]
[PDF 823 KB]
(27)
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108503 |
Yan Zeng(曾严), Xiao-Jin Li(李小进), Jian Qing(卿健), Ya-Bin Sun(孙亚宾), Yan-Ling Shi(石艳玲), Ao Guo(郭奥), Shao-Jian Hu(胡少坚) |
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Detailed study of NBTI characterization in 40-nm CMOS process using comprehensive models |
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Chin. Phys. B
2017 Vol.26 (10): 108503-108503
[Abstract]
(631)
[HTML 1 KB]
[PDF 701 KB]
(265)
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97304 |
Cao Yan-Rong (曹艳荣), Yang Yi (杨毅), Cao Cheng (曹成), He Wen-Long (何文龙), Zheng Xue-Feng (郑雪峰), Ma Xiao-Hua (马晓华), Hao Yue (郝跃) |
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Recovery of PMOSFET NBTI under different conditions |
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Chin. Phys. B
2015 Vol.24 (9): 97304-097304
[Abstract]
(806)
[HTML 1 KB]
[PDF 362 KB]
(395)
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117303 |
Cao Yan-Rong (曹艳荣), He Wen-Long (何文龙), Cao Cheng (曹成), Yang Yi (杨毅), Zheng Xue-Feng (郑雪峰), Ma Xiao-Hua (马晓华), Hao Yue (郝跃) |
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Effect of gate length on the parameter degradation relations of PMOSFET under NBTI stress |
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Chin. Phys. B
2014 Vol.23 (11): 117303-117303
[Abstract]
(585)
[HTML 1 KB]
[PDF 365 KB]
(454)
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57304 |
Zhang Yue (张月), Zhuo Qing-Qing (卓青青), Liu Hong-Xia (刘红侠), Ma Xiao-Hua (马晓华), Hao Yue (郝跃) |
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Flat-roof phenomenon of dynamic equilibrium phase in the negative bias temperature instability effect on a power MOSFET |
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Chin. Phys. B
2014 Vol.23 (5): 57304-057304
[Abstract]
(539)
[HTML 1 KB]
[PDF 303 KB]
(388)
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309 |
Cao Yan-Rong(曹艳荣), Hao Yue(郝跃), Ma Xiao-Hua(马晓华), and Hu Shi-Gang(胡仕刚) |
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Effect of substrate bias on negative bias temperature instability of ultra-deep sub-micro p-channel metal--oxide--semiconductor field-effect transistors |
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Chin. Phys. B
2009 Vol.18 (1): 309-314
[Abstract]
(1309)
[HTML 1 KB]
[PDF 231 KB]
(928)
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2111 |
Liu Hong-Xia (刘红侠) and Hao Yue (郝跃) |
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Actions of negative bias temperature instability (NBTI) and hot carriers in ultra-deep submicron p-channel metal--oxide--semiconductor field-effect transistors (PMOSFETs) |
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Chin. Phys. B
2007 Vol.16 (7): 2111-2115
[Abstract]
(1557)
[HTML 1 KB]
[PDF 462 KB]
(885)
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1445 |
Liu Hong-Xia(刘红侠), Li Zhong-He(李忠贺), and Hao Yue(郝跃) |
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Degradation characteristics and mechanism of PMOSFETs under NBT--PBT--NBT stress |
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Chin. Phys. B
2007 Vol.16 (5): 1445-1449
[Abstract]
(1449)
[HTML 1 KB]
[PDF 458 KB]
(833)
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